High-low temperature wet heat alternating experiment box heat dissipation non-heating test

The high-low temperature damp heat alternating test chamber test sample is considered to be heat-dissipating only when the temperature is stable: when the temperature is stable, the hottest surface of the test sample is measured under free air conditions (for example, low gas flow rate cycle). The temperature exceeds the air temperature around the test sample by more than 5K. The low temperature test Ab is applicable when the relevant specification requires a storage or transport test, or if no load is specified during the test.

Heat test sample with or without forced air circulation test

The better test method for the heat-dissipation test sample of the high-low temperature wet heat alternating test chamber is carried out without forced air circulation. If it is difficult to meet this requirement, the test Ad method can be used when the heat-dissipation test sample has forced air circulation.


There are two methods for testing forced air circulation: Method A and Method B. Method A is for the test chamber to be large enough without the need for forced air circulation to meet the test requirements, but the specified low temperature environment cannot be maintained without forced air circulation in the test chamber. Method B is used for high and low temperature wet heat alternating experimental box is too small, can not meet the test requirements without forced air circulation.

Non-heat-dissipation test samples: comparison of temperature abrupt test and temperature gradual test

Temperature abrupt test Aa: First adjust the temperature of the high-low temperature damp heat alternating test chamber to the specified test temperature, and then put the test sample with room temperature, which is a simple time-saving method. This test method is suitable for the known temperature mutation. When there is no damage to the test sample.

Temperature Gradient Test Ab: The test sample with room temperature was first placed in a test chamber at room temperature, and then the temperature of the test chamber was gradually cooled to the specified test temperature. This test method does not damage the test sample due to temperature changes.

Note: If the size of the test sample is too large, or due to complicated functional test wiring, the test Ab should also be used when it is not possible to put it into the low temperature test box without causing frost during the mutation test.

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